In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility

Author： Etgens V.H. Martins Alves M.C. Tadjeddine A.

Publisher： Elsevier

ISSN： 0013-4686

Source： Electrochimica Acta, Vol.45, Iss.4, 1999-11, pp. : 591-599

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