Study of a thin anodic oxide on n-InP by photocurrent transient, capacitance measurements and surface analysis

Author: Simon N.   Gerard I.   Mathieu C.   Etcheberry A.  

Publisher: Elsevier

ISSN: 0013-4686

Source: Electrochimica Acta, Vol.47, Iss.16, 2002-06, pp. : 2625-2631

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Abstract