Stochastic simulation of soil strength/compaction and assessment of corn yield risk using threshold probability patterns

Author: Lapen D.R.   Topp G.C.   Hayhoe H.N.   Gregorich E.G.   Curnoe W.E.  

Publisher: Elsevier

ISSN: 0016-7061

Source: Geoderma, Vol.104, Iss.3, 2001-12, pp. : 325-343

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Abstract