Depth profile of the lattice constant of the Cu-poor surface layer in (Cu 2 Se) 1-x (In 2 Se 3 ) x evidenced by grazing incidence X-ray diffraction

Author： Kotschau I.M.   Schock H.W.  

Publisher： Elsevier

ISSN： 0022-3697

Source： Journal of Physics and Chemistry of Solids, Vol.64, Iss.9, 2003-09, pp. : 1559-1563

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