Quality assessment of chalcopyrite thin films using Raman spectroscopy

Author： Rudigier E.   Alvarez-Garcia J.   Luck I.   Klaer J.   Scheer R.  

Publisher： Elsevier

ISSN： 0022-3697

Source： Journal of Physics and Chemistry of Solids, Vol.64, Iss.9, 2003-09, pp. : 1977-1981

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