Author: Harris R.D. Van Stipdonk M.J. Schweikert E.A.
Publisher: Elsevier
ISSN: 0168-1176
Source: International Journal of Mass Spectrometry and Ion Processes, Vol.174, Iss.1, 1998-03, pp. : 167-177
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
MASS DISTRIBUTION OF PRODUCTS OF CLUSTER IMPACTS
Le Journal de Physique Colloques, Vol. 50, Iss. C2, 1989-02 ,pp. :
High depth resolution SIMS analysis using metal cluster complex ion bombardment
Journal of Physics: Conference Series , Vol. 100, Iss. 1, 2008-03 ,pp. :
Astronomy & Astrophysics, Vol. 494, Iss. 3, 2009-02 ,pp. :
Journal of Physics: Conference Series , Vol. 664, Iss. 9, 2015-12 ,pp. :