Author: Holt C.L. Stauffer C. Wallin J.M. Lazaruk K.D. Nguyen T. Budowle B. Walsh P.S.
Publisher: Elsevier
ISSN: 0379-0738
Source: Forensic Science International, Vol.112, Iss.2, 2000-08, pp. : 91-109
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Abstract
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