Classification of counterfeit coins using multivariate analysis with X-ray diffraction and X-ray fluorescence methods

Author: Hida M.   Sato H.   Sugawara H.   Mitsui T.  

Publisher: Elsevier

ISSN: 0379-0738

Source: Forensic Science International, Vol.115, Iss.1, 2001-01, pp. : 129-134

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