Characterisation of thin films of the organic infra-red emitters Yb- and Er-tris(8-hydroxyquinoline) by X-ray photoemission spectroscopy

Author： Blyth R.I.R.   Thompson J.   Zou Y.   Fink R.   Umbach E.   Gigli G.   Cingolani R.  

Publisher： Elsevier

ISSN： 0379-6779

Source： Synthetic Metals, Vol.139, Iss.2, 2003-09, pp. : 207-213

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Investigation of the Micellization in Thin Films Using Resonant Soft X-Ray Scattering

By  

IOP Conference Series: Materials Science and Engineering, Vol. 14, Iss. 1, 2010-11 ,pp. : 140-146

IOP Publishing

Access to resources Recommend Favorite

X-ray diffraction and infrared spectroscopy analyses on the crystallinity of engineered biological hydroxyapatite for medical application

By  

IOP Conference Series: Materials Science and Engineering, Vol. 79, Iss. 1, 2015-06 ,pp. : 203-208

IOP Publishing

Access to resources Recommend Favorite

Characterization of Stoichiometric ZrO2 Thin Film on Si by Angle-Resolved X-Ray Photoelectron Spectroscopy

By  

Key Engineering Materials, Vol. 2016, Iss. 701, 2016-08 ,pp. : 77-82

Trans Tech Publications

Access to resources Recommend Favorite

Refracted X-Ray Fluorescence (RXF) Applied to the Study of Thin Films and Thermally-Grown Oxide Scales

By Koshelev I.   Paulikas A.P.   Veal B.W.  

Oxidation of Metals, Vol. 51, Iss. 1-2, 1999-02 ,pp. : 23-54

Springer Publishing Company

Access to resources Recommend Favorite

In-situ X-ray reflectivity measurement of polyvinyl acetate thin films during glass transition

By  

IOP Conference Series: Materials Science and Engineering, Vol. 24, Iss. 1, 2011-09 ,pp. : 92-96

IOP Publishing

Access to resources Recommend Favorite