The influence of bulk traps on the subthreshold characteristics of an organic field effect transistor

Author: Scheinert S.   Paasch G.   Doll T.  

Publisher: Elsevier

ISSN: 0379-6779

Source: Synthetic Metals, Vol.139, Iss.2, 2003-09, pp. : 233-237

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract