Characterization of Ba(Zr 0.05 Ti 0.95 )O 3 thin film prepared by sol-gel process

By Cheng W.   Ding A.   He X.   Zheng X.   Qiu P.  

Journal of Electroceramics, Vol. 16, Iss. 4, 2006-07 ,pp. : 523-526

Springer Publishing Company

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Substrate effect on in-plane ferroelectric and dielectric properties of Ba 0.7 Sr 0.3 TiO 3 thin films

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Journal of Electroceramics, Vol. 16, Iss. 4, 2006-07 ,pp. : 587-591

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Microwave Dielectric Properties of Ferroelectric BaTiO 3 Thin Film

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Influence of anatase-rutile phase transformation on dielectric properties of sol-gel derived TiO 2 thin films

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Structural and Dielectric Characterization of Sol-Gel Fabricated PbTiO 3 Thin Films Doped with Lanthanide Ions

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Journal of Electroceramics, Vol. 10, Iss. 2, 2003-05 ,pp. : 103-110

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