Microwave Dielectric Mechanism Studied by Microwave Near-Field Microscopy and Raman Spectroscopy

By Chen Yi-Chun  

Journal of Electroceramics, Vol. 13, Iss. 1-3, 2004-07 ,pp. : 281-286

Springer Publishing Company

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Measurement of Microwave Dielectric Properties of Pb(Zr 1−x Tr x )O 3 Thin Films

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Journal of Electroceramics, Vol. 13, Iss. 1-3, 2004-07 ,pp. : 257-260

Springer Publishing Company

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Nonlinear Microwave Properties of Ferroelectric Thin Films

By Wördenweber R.   Ott R.   Lahl P.  

Journal of Electroceramics, Vol. 13, Iss. 1-3, 2004-07 ,pp. : 223-227

Springer Publishing Company

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The Effect of Stress on the Microwave Dielectric Properties of \hbox{Ba}_{0.5}\hbox{Sr}_{0.5}\hbox{TiO}_{3} Thin Films

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Journal of Electroceramics, Vol. 4, Iss. 2-3, 2000-06 ,pp. : 357-363

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Microwave Dielectric Properties of Ferroelectric BaTiO 3 Thin Film

By Cho Y.   Hyun T.   Choi S.  

Journal of Electroceramics, Vol. 13, Iss. 1-3, 2004-07 ,pp. : 251-255

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