Growth and characterization of device quality ZnO on Si(111) and c-sapphire using a conventional rf magnetron sputtering

Author: Lee Byung-Teak   Jeong Sang-Hun   Kim Myong-Ho   Kuk Min-Ho   Bae Dong-Sik   Song Tae-Kwon   Kim Won-Jeong  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.17, Iss.2-4, 2006-12, pp. : 305-310

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