Defect Chemistry of \hbox{SrBi}_{2}\hbox{Ta}_{2}\hbox{O}_{9} and Ferroelectric Fatigue Endurance

Author: Palanduz A.C.   Smyth D.M.  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.5, Iss.1, 2000-08, pp. : 21-30

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content