The Effect of Stress on the Microwave Dielectric Properties of \hbox{Ba}_{0.5}\hbox{Sr}_{0.5}\hbox{TiO}_{3} Thin Films

By Horwitz J.S.   Chang W.   Kim W.   Qadri S.B.   Pond J.M.   Kirchoefer S.W.   Chrisey D.B.  

Journal of Electroceramics, Vol. 4, Iss. 2-3, 2000-06 ,pp. : 357-363

Springer Publishing Company

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Ferroelectric Properties of the \hbox{La}_{0.03}\hbox{Sr}_{0.255}\hbox{Ba}_{0.7}\hbox{Nb}_{2\minus y}\hbox{Ti}_{y}\hbox{O}_{6\minus y/2} Ceramic System*

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Journal of Electroceramics, Vol. 3, Iss. 4, 1999-10 ,pp. : 371-375

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Dielectric Properties of \hbox{La}^{3+} Doped \hbox{Sr}_{0.3\minus3y/2}\hbox{La}_{y} \hbox{Ba}_{0.7}\hbox{Nb}_{2}\hbox{O}_{6} Ceramics Prepared under Different Sintering Conditions*

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Journal of Electroceramics, Vol. 3, Iss. 4, 1999-10 ,pp. : 377-385

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Diffuse Phase Transition of the \hbox{Sr}_{0.3-3{ y}/2} \hbox{La}_{ y} \hbox{Ba}_{0.7} \hbox{Nb}_{2} \hbox{O}_{6} Ceramic System

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Multilayer Ceramic Capacitors with Thin \hbox{(Ba,Sr)TiO}_{3} Layers by MOCVD

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