Investigation of the effects of polishing and etching on the quality of Cd 1−x Zn x Te using spatial mapping techniques

Author： Yoon H.   Scyoc J.   Goorsky M.   Hermon H.   Schieber M.   Lund J.   James R.  

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.26, Iss.6, 1997-06, pp. : 529-533

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