Characterization of HgCdTe p-on-n heterojunction photodiodes and their defects using variable-area test structures

Author: Weiler M.   Tarnowski G.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.6, 1997-06, pp. : 635-642

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract