Oxygen-related deep levels in Al 0.5 In 0.5 P grown by MOVPE

Author: Cederberg J.   Bieg B.   Huang J.   Stockman S.   Peanasky M.   Kuech T.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.29, Iss.4, 2000-04, pp. : 426-429

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Abstract