Transmission electron microscopy studies of defects in HgCdTe device structures grown by molecular beam epitaxy

Author： Zhao Lijie   Speck J.   Rajavel R.   Jensen J.   Leonard D.   Strand T.   Hamilton W.  

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.29, Iss.6, 2000-06, pp. : 732-735

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