Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion

Author： Kim Young-Ho   Bae Soo-Ho   Lee Hee   Kim Choong  

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.29, Iss.6, 2000-06, pp. : 832-836

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