Assessment of Tight Pixel Geometry Influence on Surface Chemistry of Hg 1−X Cd X Te Focal Plane Array by Time of Flight–Secondary Ion Mass Spectroscopy: Novel Analytical Methods

Author： Garwood G.   Olshove R.   Pettijohn E.   Bangs J.   Liguori M.   Olson E.   Lua F.  

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.36, Iss.8, 2007-08, pp. : 937-948

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