Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature

Author： Wu X.S.   Hase T.P.A.   Tanner B.K.   Cheng H.H.  

Publisher： Elsevier

ISSN： 0039-6028

Source： Surface Science, Vol.548, Iss.1, 2004-01, pp. : 239-245

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