Author: Kangaslahti P.
Publisher: Springer Publishing Company
ISSN: 0925-1030
Source: Analog Integrated Circuits and Signal Processing, Vol.15, Iss.1, 1998-01, pp. : 123-133
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
By Ramadoss R.
Journal of Electronic Testing, Vol. 14, Iss. 3, 1999-06 ,pp. :
By Vázquez Diego Huertas Gloria Luque África Barragán Manuel Leger Gildas Rueda Adoración Huertas José
Journal of Electronic Testing, Vol. 21, Iss. 3, 2005-06 ,pp. :
A novel millimetre wave EBG-SIW wideband delay line
International Journal of Electronics, Vol. 100, Iss. 6, 2013-06 ,pp. :