An Analog Self-Test Based on Differential I_{\tf="P6965" DD} Monitoring Supported by Differential I_{\tf="P6965"OUT} Checking

Author: Sidiropulos M.  

Publisher: Springer Publishing Company

ISSN: 0925-1030

Source: Analog Integrated Circuits and Signal Processing, Vol.21, Iss.1, 1999-10, pp. : 33-44

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Abstract