Effects of Noise and Jitter in Bandpass Sampling: Selected Papers from the NORCHIP 2003 Conference (Guest Editors: Timo Rahkonen and Elmars Bekeris)

Author: Sun Yi-Ran   Signell Svante  

Publisher: Springer Publishing Company

ISSN: 0925-1030

Source: Analog Integrated Circuits and Signal Processing, Vol.42, Iss.1, 2005-01, pp. : 85-97

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