Utilisation of a micro-tip scanning Kelvin probe for non-invasive surface potential mapping of mc-Si solar cells

Author: Dirscherl K.   Baikie I.   Forsyth G.   Heide A.v.d.  

Publisher: Elsevier

ISSN: 0927-0248

Source: Solar Energy Materials and Solar Cells, Vol.79, Iss.4, 2003-09, pp. : 485-494

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Abstract