

Author: Strelkov V. Zair A. Tcherbakoff O. López-Martens R. Cormier E. Mével E. Constant E.
Publisher: Springer Publishing Company
E-ISSN: 1432-0649|78|7-8|879-884
ISSN: 0946-2171
Source: Applied Physics B, Vol.78, Iss.7-8, 2004-05, pp. : 879-884
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content


Extending optical fs metrology to XUV attosecond pulses
By Tzallas P.
Applied Physics A, Vol. 79, Iss. 7, 2004-11 ,pp. :





