Author: Liu W. Théberge F. Daigle J.-F. Simard P.T. Sarifi S.M. Kamali Y. Xu H.L. Chin S.L.
Publisher: Springer Publishing Company
ISSN: 0946-2171
Source: Applied Physics B, Vol.85, Iss.1, 2006-10, pp. : 55-58
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Abstract