Probing induced defects in individual carbon nanotubes using electrostatic force microscopy

Author: Sand Jespersen T.   Nygård J.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.88, Iss.2, 2007-08, pp. : 309-313

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract