The joined use of n.i. spectroscopic analyses – FTIR, Raman, visible reflectance spectrometry and EDXRF – to study drawings and illuminated manuscripts

Author： Bruni S.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.92, Iss.1, 2008-07, pp. : 103-108

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