Ultrafast dynamic ellipsometry measurements of early time laser ablation of titanium thin films

Author: Bolme C.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.92, Iss.4, 2008-09, pp. : 761-766

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract