Author: Lee Joohyung Han Seongheum Lee Keunwoo Bae Eundeok Kim Seungman Lee Sanghyun Kim Seung-Woo Kim Young-Jin
Publisher: IOP Publishing
ISSN: 0957-0233
Source: Measurement Science and Technology, Vol.24, Iss.4, 2013-04, pp. : 45201-45208
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