Author: Iwuoha E.I. Saenz de Villaverde D. Garcia N.P. Smyth M.R. Pingarron J.M. Law Y.F.D. Sew B.F. Kwan S.E.J.
Publisher: Elsevier
ISSN: 0957-4174
Source: Expert Systems with Applications, Vol.13, Iss.4, 1997-11, pp. : 265-274
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Abstract