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Author: Nomura Y. Ikebukuro K. Yokoyama K. Takeuchi T. Arikawa Y. Ohno S. Karube I. Valenzuela-Rendon M.
Publisher: Elsevier
ISSN: 0957-4174
Source: Expert Systems with Applications, Vol.14, Iss.1, 1998-01, pp. : 237-247
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