Friction force microscopy: a simple technique for identifying graphene on rough substrates and mapping the orientation of graphene grains on copper

Author： Marsden A.J.   Phillips M.   Wilson N.R.  

Publisher： IOP Publishing

ISSN： 0957-4484

Source： Nanotechnology, Vol.24, Iss.25, 2013-06, pp. : 255704-255712

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Atomic force microscopy based manipulation of graphene using dynamic plowing lithography

By Vasić Borislav   Kratzer Markus   Matković Aleksandar   Nevosad Andreas   Ralević Uroš   Jovanović Djordje   Ganser Christian   Teichert Christian   Gajić Radoš  

Nanotechnology, Vol. 24, Iss. 1, 2013-01 ,pp. : 15303-15311

IOP Publishing

Access to resources Recommend Favorite

Study of nanotribological properties of multilayer graphene by calibrated atomic force microscopy

By Peng Yitian   Wang Zhuoqiong   Li Cong  

Nanotechnology, Vol. 25, Iss. 30, 2014-08 ,pp. : 305701-305709

IOP Publishing

Access to resources Recommend Favorite

A simple criterion for determining the static friction force between nanowires and flat substrates using the most-bent-state method

By Hou Lizhen   Wang Shiliang   Huang Han  

Nanotechnology, Vol. 26, Iss. 16, 2015-04 ,pp. : 165702-165708

IOP Publishing

Access to resources Recommend Favorite

Determining charge state of graphene vacancy by noncontact atomic force microscopy and first-principles calculations

By  

Nanotechnology, Vol. 26, Iss. 3, 2015-01 ,pp. : 35702-35709

IOP Publishing

Access to resources Recommend Favorite

A simple approach to the synthesis of BCN graphene with high capacitance

By  

Nanotechnology, Vol. 26, Iss. 4, 2015-01 ,pp. : 45402-45408

IOP Publishing

Access to resources Recommend Favorite