Total reflection X-ray fluorescence: A technique for trace element analysis in materials

Author: Misra N.L.   Singh Mudher K.D.  

Publisher: Elsevier

ISSN: 0960-8974

Source: Progress in Crystal Growth and Characterization of Materials, Vol.45, Iss.1, 2002-01, pp. : 65-74

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract