Near field inversion method to measure the material properties of a layer

Author: Stolzenburg J.C.   Doane J.W.   Jarzynski J.   Jacobs L.J.  

Publisher: Elsevier

ISSN: 0963-8695

Source: NDT and E International, Vol.36, Iss.7, 2003-10, pp. : 523-533

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Abstract