High resolution EELS using monochromator and high performance spectrometer: comparison of V 2 O 5 ELNES with NEXAFS and band structure calculations

Author： Su D.S.   Zandbergen H.W.   Tiemeijer P.C.   Kothleitner G.   Havecker M.   Hebert C.   Knop-Gericke A.   Freitag B.H.   Hofer F.   Schlogl R.  

Publisher： Elsevier

ISSN： 0968-4328

Source： Micron, Vol.34, Iss.3, 2003-04, pp. : 235-238

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