Inelastic electron scattering observation using energy filtered transmission electron microscopy for silicon-germanium nanostructures imaging

Author： Pantel R.   Jullian S.   Delille D.   Dutartre D.   Chantre A.   Kermarrec O.   Campidelli Y.   Kwakman L.F.T.Z.  

Publisher： Elsevier

ISSN： 0968-4328

Source： Micron, Vol.34, Iss.3, 2003-04, pp. : 239-247

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Investigation of boron implantation into silicon by quantitative energy-filtered transmission electron microscopy

By  

Journal of Physics: Conference Series , Vol. 326, Iss. 1, 2011-11 ,pp. : 287-292

IOP Publishing

Access to resources Recommend Favorite

Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope

By  

Journal of Physics: Conference Series , Vol. 241, Iss. 1, 2010-07 ,pp. : 57-60

IOP Publishing

Access to resources Recommend Favorite

Analysis of partially oxidised epitaxial silicon mono-layers on germanium virtual substrates using aberration corrected scanning transmission electron microscopy

By  

Journal of Physics: Conference Series , Vol. 326, Iss. 1, 2011-11 ,pp. : 275-278

IOP Publishing

Access to resources Recommend Favorite

Observation of structural vacancies in titanium monoxide using transmission electron microscopy

By Valeeva A.   Tang G.   Gusev A.   Rempel’ A.  

Physics of the Solid State, Vol. 45, Iss. 1, 2003-01 ,pp. : 87-93

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

A transmission electron microscopy study of porous silicon

By  

Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. : 272-275

IOP Publishing

Access to resources Recommend Favorite