Surface roughness in Langmuir-Blodgett multilayer films studied by AFM and X-ray diffraction

Author: Rozlosnik N.   Antal G.   Pusztai T.   Faigel G.  

Publisher: Elsevier

ISSN: 0968-5677

Source: Supramolecular Science, Vol.4, Iss.3, 1997-09, pp. : 215-218

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Abstract