X-ray photoelectron spectroscopy of partial and stamped thiol-based self-assembled monolayers

Author： Evans S.D.   Cooper S.D.   Johnson S.R.   Flynn T.M.   Ulman A.  

Publisher： Elsevier

ISSN： 0968-5677

Source： Supramolecular Science, Vol.4, Iss.3, 1997-09, pp. : 247-253

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Evaluation of Fluorinated Self‐Assembled Monolayer by Photoelectron and Near Edge X‐Ray Absorption Fine Structure Spectroscopy

By  

ELECTRONICS & COMMUNICATIONS IN JAPAN, Vol. 98, Iss. 11, 2015-11 ,pp. : 35-40

John Wiley & Sons Inc

Access to resources Recommend Favorite

Characterisation of alkanethiol (C n H 2n+1 SH, n = 3, 4, 6, 8, 10, 12 and 18) self assembled monolayers by X-ray photoelectron spectroscopy

By Bindu V.   Pradeep T.  

Vacuum, Vol. 49, Iss. 1, 1998-01 ,pp. : 63-66

Elsevier

Access to resources Recommend Favorite

FTIR-ATR study of self-assembled thiol monolayers on gold

By Yoshihara H.A.I.   Chiellini G.   Mitchison T.J.   Scanlan T.S.   Zu R.   Ding H.   Li W.   Wang D.   Xi S.  

Supramolecular Science, Vol. 5, Iss. 5, 1998-10 ,pp. : 607-609

Elsevier

Access to resources Recommend Favorite

X-ray diffraction and reflection from self-assembled Ge dots

By Darhuber A.A.   Stangl J.   Bauer G.   Schittenhelm P.   Abstreiter G.  

Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. : 296-299

Elsevier

Access to resources Recommend Favorite

New frontiers in X-ray photoelectron spectroscopy

By McIntyre N.S.   Davidson R.D.   Kim G.   Francis J.T.  

Vacuum, Vol. 69, Iss. 1, 2002-12 ,pp. : 63-71

Elsevier

Access to resources Recommend Favorite