Author: Udod V. Lebedev M. Klimenov V. Solodushkin V. Temnik A.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1061-8309
Source: Russian Journal of Nondestructive Testing, Vol.47, Iss.2, 2011-02, pp. : 130-135
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
3D scanning by multiple fan beam X-ray sources and sensors
By Benjamin Ralph Prakoonwit Simant
Sensor Review, Vol. 25, Iss. 1, 2005-03 ,pp. :
LIGHT ELEMENT WAVELENGTH DISPERSIVE X-RAY ANALYSIS IN SCANNING ELECTRON MICROSCOPE
By Hall M. G.
Surface Engineering, Vol. 9, Iss. 3, 1993-01 ,pp. :