Charge spectroscopy of SiO 2 layers with embedded silicon nanocrystals modified by irradiation with high-energy ions

Author： Antonova I.   Smagulova S.   Neustroev E.   Skuratov V.   Jedrzejewski J.   Savir E.   Balberg I.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7826

Source： Semiconductors, Vol.45, Iss.5, 2011-05, pp. : 582-586

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