Structural changes and thermal stability: in situ X-ray diffraction studies of a new cathode material LiMg 0.125 Ti 0.125 Ni 0.75 O 2

Author: Yang X.Q.   Sun X.   McBreen J.  

Publisher: Elsevier

ISSN: 1388-2481

Source: Electrochemistry Communications, Vol.2, Iss.10, 2000-10, pp. : 733-737

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Abstract