Trapping of transient processes in aluminium oxide thin films in a voltage pulse experiment

Author: Hassel A.W.   Diesing D.  

Publisher: Elsevier

ISSN: 1388-2481

Source: Electrochemistry Communications, Vol.4, Iss.1, 2002-01, pp. : 1-4

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract