Wavelength-dependent measurement and evaluation of surface topographies: application of a new concept of window roughness and surface transfer function

Author： Wieland M.   Hanggi P.   Hotz W.   Textor M.   Keller B.A.   Spencer N.D.  

Publisher： Elsevier

ISSN： 0043-1648

Source： Wear, Vol.237, Iss.2, 2000-02, pp. : 231-252

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Roughness measurement by confocal microscopy for brightness characterization and surface waviness visibility evaluation

By Sandoz P.   Tribillon G.   devillers R.   Gharbi T.  

Wear, Vol. 201, Iss. 1, 1996-12 ,pp. : 186-192

Elsevier

Access to resources Recommend Favorite

Wear of single crystal silicon as a function of surface roughness

By Gatzen H.H.   Beck M.  

Wear, Vol. 254, Iss. 9, 2003-05 ,pp. : 907-910

Elsevier

Access to resources Recommend Favorite

In-process measurement of surface roughness using light scattering

By Persson U.  

Wear, Vol. 215, Iss. 1, 1998-03 ,pp. : 54-58

Elsevier

Access to resources Recommend Favorite

Characterisation of surface roughness by laser light scattering: diffusely scattered intensity measurement

By Le Bosse J.C.   Hansali G.   Lopez J.   Dumas J.C.  

Wear, Vol. 224, Iss. 2, 1999-02 ,pp. : 236-244

Elsevier

Access to resources Recommend Favorite

Characterisation of surface roughness by laser light scattering: Specularly scattered intensity measurement

By Le Bosse J.C.   Hansali G.   Lopez J.   Mathia T.  

Wear, Vol. 209, Iss. 1, 1997-08 ,pp. : 328-337

Elsevier

Access to resources Recommend Favorite