Author: Ho S.P. Carpick R.W. Boland T. LaBerge M.
Publisher: Elsevier
ISSN: 0043-1648
Source: Wear, Vol.253, Iss.11, 2002-12, pp. : 1145-1155
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Quantitative wear analysis using atomic force microscopy
Wear, Vol. 222, Iss. 2, 1998-11 ,pp. :
A re-appraisal of wear features of acetabular sockets using atomic force microscopy
By Elfick A.P.D. Smith S.L. Green S.M. Unsworth A.
Wear, Vol. 253, Iss. 7, 2002-10 ,pp. :
The microstructure of thin films observed using atomic force microscopy
Thin Solid Films, Vol. 257, Iss. 1, 1995-02 ,pp. :
Local elasticity measurement on polymers using atomic force microscopy
By Nie H.-Y. Mizutani W. Tokumoto H. Motomatsu M.
Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. :