Author: Reitz F.B. Fauver M.E. Pollack G.H.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.90, Iss.4, 2002-04, pp. : 259-264
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Light confinement in scanning near-field optical microscopy
By Novotny L. Pohl D.W. Hecht B.
Ultramicroscopy, Vol. 61, Iss. 1, 1995-12 ,pp. :