Author： Stephan A.C. Finot E.L. Ji H. Pinnaduwage L.A. Thundat T.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.91, Iss.1, 2002-05, pp. : 1-8
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Parallel electron energy-loss spectroscopy free from gain variation
By Feng J.L. Ho R. Shao Z. Somlyo A.P.
Ultramicroscopy, Vol. 76, Iss. 4, 1999-04 ,pp. :
Access to resources
Recommend
Fast screening target sites for RNA interference using a cell-free system
By Mei Huang
Biotechnology Letters, Vol. 27, Iss. 9, 2005-05 ,pp. :
Imaging of the boron doping in silicon using low energy SEM
By Mullerova I. El-Gomati M.M. Frank L.
Ultramicroscopy, Vol. 93, Iss. 3, 2002-12 ,pp. :
Textured silicon nitride: processing and anisotropic properties
Science and Technology of Advanced Materials, Vol. 9, Iss. 3, 2008-07 ,pp. :
Access to resources