Simplified computation of third-rank image aberrations of electron-optical systems with curved axis

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.93, Iss.3, 2002-12, pp. : 305-319

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Numerical calculation of electron optical aberrations

By Kasper E.

Ultramicroscopy, Vol. 93, Iss. 3, 2002-12 ,pp. : 247-252

Elsevier

Access to resources Recommend Favorite

Theory of electron-optical achromats and apochromats

By Rose H.

Ultramicroscopy, Vol. 93, Iss. 3, 2002-12 ,pp. : 293-303

Elsevier

Access to resources Recommend Favorite

On the reliability of quantitative phase measurements by low magnification off-axis image plane electron holography

By Frost B.G. Voelkl E.

Ultramicroscopy, Vol. 72, Iss. 3, 1998-05 ,pp. : 101-107

Elsevier

Access to resources Recommend Favorite

A study of digital X-ray detection systems with optical image transfer

By Kanter B. Vladimirov L. Lygin V. Medvedeva N. Chulyukov G.

Biomedical Engineering, Vol. 40, Iss. 5, 2006-09 ,pp. : 258-261

Springer Publishing Company

Access to resources Recommend Favorite

Measurement of lens aberrations by means of image displacements in beam-tilt series

By Steinecker A. Mader W.

Ultramicroscopy, Vol. 81, Iss. 3, 2000-04 ,pp. : 149-161

Elsevier

Access to resources Recommend Favorite